Laboratoire MAPIEM (UR 4323)

Tabletop Scanning Electron Microscope (HITACHI TM4000Plus II)

IM — 2023-05-04T13:03:00Z

The Hitachi TM4000Plus II is a benchtop scanning electron microscope (SEM) that allows for the observation of hydrated samples without the need for prior metallization. This technique brings the advantage to work with non-conductive samples in low vacuum conditions. Environmental scanning microscopy is based on the emission of a thermionic electron beam from the tungsten filament, where secondary electrons and backscattered electrons give information about the topography and composition of (…)

- Observation

Digital microscope (HIROX - KH-7700)

IM — 2019-04-08T13:34:05Z

- Observation

Binocular microscope (OLYMPUS - sz11 tr)

2016-06-10T13:30:21Z

- Observation

Inverted Confocal Microscope (ZEISS - lsm 510 meta)

2016-06-10T13:25:03Z

- Observation

Inverted Binocular Microscope (MOTIC-ae20/21)

webmaster — 2016-06-10T13:23:55Z

- Observation

Binocular Microscope (OLYMPUS-cx21 fs1)

2016-06-10T13:20:58Z

- Observation

Optical microscope (OLYMPUS-hb2)

2016-06-10T13:20:05Z

The light microscope is used for a wide range of applications, from routine laboratory work to educational and research investigations. It employs visible light and a system of lenses to magnify the images of small objects.
Available objectives are 5X, 10X, 20X and 50X.
The microscope is equipped with a CCD camera (Olympus C-5050) for digital data recording, and a hot stage (Mettler FP90) for visually examining all kinds of thermal transitions when the sample is heated or cooled.

- Observation

Scanning Electron Microscopy (ZEISS-supra 40 vp/gemini column)

2016-06-10T13:18:43Z

Scanning Electron Microscope (SEM) scan a sample with a focused electron beam and deliver images with information about the sample's morphology and composition.
Our microscope is equipped with several detectors: Secondary and Backscattered electron detectors, an In-lens electron detector, a Secondary electron detector for environmental conditions and an Oxford Energy-dispersive X-ray Spectroscopy (EDS). It operates in both high vacuum and variable pressure modes with a high resolution. (…)

- Observation

Atomic Force Microscope (BRUKER AXS - multimode 8)

2016-06-10T13:17:40Z

AFM microscopy provides high resolution 2D and 3D images by scanning a physical sharp probe over a sample surface. The microscope has several scanning modes available: Tapping mode, Contact mode and PeakForce QNM (Quantitative NanoMechanics). The latest one (PF-QNM) enables quantitative measurements of nano-scale material properties such as modulus, adhesion, deformation and dissipation.
Our AFM microscope is equipped with a Thermal Analysis accessory (Nano-TA), which allows to locally (…)

- Observation