Atomic Force Microscope (BRUKER AXS - multimode 8)
AFM microscopy provides high resolution 2D and 3D images by scanning a physical sharp probe over a sample surface. The microscope has several scanning modes available: Tapping mode, Contact mode and PeakForce QNM (Quantitative NanoMechanics). The latest one (PF-QNM) enables quantitative measurements of nano-scale material properties such as modulus, adhesion, deformation and dissipation.
Our AFM microscope is equipped with a Thermal Analysis accessory (Nano-TA), which allows to locally characterize the thermal behavior of materials.
The analysis can be done on many types of samples: metals, polymer, composite, adsorbed molecules, thin films, biofilms and cells. AFM manipulations can be released in ambient and liquid environments.
– 2D and 3D topography observation with very high resolution
– Surface roughness measurement (Rq, Ra, max. z range 4 µm)
– Simultaneous topography, adhesive, mechanical and deformation mappings
– Thermal mapping (Tg, Tm) of the surface
– Characterization of adhesion and friction properties at the nanoscale